EC2354 VLSI Design Solved Question Bank - Deepak Edition

  • 5Feb
  • 2015
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    Anna University , Chennai
    Department of B.E. Electronics and Communication Engineering
    Sixth Semester
    EC2354 VLSI Design
    Solved Question Bank - Deepak Edition
    (Regulation 2008)

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    Content :
    VLSI DESIGN

    Typical CAD tools set
    Body effect
    Tristate inverter
    Phases of the VLSI design flow
    1. Logical verification and testing
    2. Floor planning automatic place and route
    3. Layout verification
    4. Implementation
    Transmission gate
    Principle of electronic testing
    Process of IC fabrication
    1. Wafer processing
    2. Oxidation
    3. Epitaxy
    4. Deposition
    5. Ion implementation
    6. Diffusion
    Sensitivity list
    Bubble pushing
    Techniques of ad-HOC testing
    IDDQ testing
    Energy band diagram
    Propogation delay
    Fabrication process of the NMOS transistor
    Rules for the CMOS inverters
    1. Layout design rules
    Active area
    1. Minimum size
    2. Minimum spacing
    Detailed MOS gate capacitance model
    CMOS process enhancement
    Interconnect
    1. Metal interconnect
    2. Polysilicon interconnect
    3. Local interconnect
    Cut off
    Linear
    Saturation
    Chennal length modulation
    Tunneling
    N-MOS ENHANCEMENT TRANSISTOR
    1. Accumulation mode
    2. Depletion mode
    3. Inversion mode
    Tap architecture
    Instruction register
    1. EXTEST
    2. Sample load
    3. Bypass
    4. Runbist
    5. Intest
    Purpose of text bench
    Wave form generation
    1. Blocking procedural assignment
    2. Non-blocking procedural assignment
    Serial scan approach
    Partial serial scan approach
    Module instantiation
    Program for half adder
    Gate – level modeling
    Multi output gates-gate primives
    Various bidirection switches
    Various region of DC transfer characteristics curve
    SOI technology
    Static power reduction
    Dynamic power reduction
    Sequencing dynamic circuits
    1. Precharge mode
    2. Evalution mode
    Traditional mode
    Silicon debug principle
    Fault models
    Types of failure
    1. Manufacturing
    2. Functional
    3. Electrical
    Objectives of self-test techniques
    Signature analysis
    Three ways of specifying delays
    DC and transfer characteristics of a CMOS inverters
    Divisional structure
    Interconnect
    Power dissipation
    Instaneous power
    Types of power dissipation
    Total power
    Static power dissipation
    Dynamic dissipation
    Inter connect scaling
    Impact on design
    Device model
    Process variation
    Problem of metastability
    Observability

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